Circuit and method for testing RF device and RF device with built-in testing circuit

ABSTRACT

In a testing circuit performing a testing operation to detect an RF circuit characteristic, a first filter unit is provided, having a first external terminal electrically coupled to a testing signal and a second external terminal electrically coupled to an RF circuit of the RF device. The first filter unit is configured to allow the testing signal to enter the RF circuit while blocking an RF signal transmitted in the RF circuit from entering the testing circuit. In addition, a testing-result informing unit is provided, having an external input electrically coupled to the first external terminal, and generating an informing signal, which indicates a condition of the RF circuit according to an electric level at the external input.

FIELD OF THE INVENTION

The present invention relates to a testing method and associatedcircuit, and more particularly to a testing method and associatedcircuit performing a testing operation to determine a radiofrequency(RF) circuit characteristic of an RF device. The present invention alsorelates to an RF device built therein a testing circuit for determiningan RF circuit characteristic thereof.

BACKGROUND OF THE INVENTION

Conventionally, if a testing procedure is performed to determine an RFcircuit characteristic of an RF device while a radiofrequency (RF)circuit of the RF device, e.g. an antenna, is working, it is likely tointerfere the function of the RF circuit and thus adversely affect thecommunication quality. Therefore, testing an RF circuit to determine theRF circuit characteristic of the RF device is generally conducted in aspecific testing mode instead of a normal working mode. In other words,the RF circuit characteristic is measured by a testing process but notin a normal process. It would cause inconvenience for testingoperations. Moreover, for a DC-Ground RF circuit whose impedancecharacteristic is grounded in direct-current (DC) frequency butnon-grounded in other frequency, a short-circuit problem cannot bescreened out by a DC voltage test. Likewise, for a DC-Open RF circuitwhose impedance characteristic is open-circuit in direct-current (DC)frequency but non-open-circuit in other frequency, a disconnectionproblem cannot be screened out by a DC voltage measurement.

The above-mentioned defects make maintenance of an RF circuitproblematic.

SUMMARY OF THE INVENTION

Therefore, an object of the present invention is to provide a testingmethod in which condition detection can be accomplished in simultaneoustesting and normal operations of the RF circuit without interfering theoperations with each other.

The present invention further provides a testing circuit whose outputallows the RF circuit characteristic to be readily realized.

The present invention further provides an RF device having a built-intesting circuit which is capable of performing a self-testing operationout of factory.

In an aspect, the present invention provides a testing circuit whichperforms a testing operation to detect an RF circuit and determine an RFcircuit characteristic of an RF device. The testing circuit comprises: afirst filter unit having a first external terminal electrically coupledto a testing signal and a second external terminal electrically coupledto an RF circuit of the RF device, wherein the first filter unit isconfigured to allow the testing signal passing therethough to enter theRF circuit while blocking an RF signal transmitted in the RF circuitfrom passing therethough and entering the testing circuit; and atesting-result informing unit having an external input electricallycoupled to the first external terminal of the first filter unit, andgenerating an informing signal, which indicates the RF circuitcharacteristic, according to an electric level at the external input ofthe testing-result informing unit.

Preferably, the testing circuit further comprises a second filter unithaving a third external terminal electrically coupled to the testingsignal and a fourth external terminal electrically coupled to the firstexternal terminal of the first filter unit.

In another aspect, the present invention provides an RF device comprisesan RF circuit and a testing circuit as described above for detecting theRF circuit characteristic.

In a further aspect, the present invention provides a testing method fordetermining an RF circuit characteristic of an RF device. The testingmethod comprises: electrically coupling a testing circuit to the RFcircuit in the RF device; transmitting a testing signal through both thetesting circuit and the RF circuit while blocking an RF signaltransmitted in the RF circuit from entering the testing circuit;generating an informing signal in response to the testing signaltransmitted through the testing circuit and the RF circuit; comparingthe informing signal with a default signal to obtain a comparisonresult; and determining the RF circuit characteristic according to thecomparison result.

In an embodiment, the testing method further comprises: updating thedefault signal for a subsequent testing operation if the RF circuitcharacteristic is determined to be a normal condition according to thecomparison result.

BRIEF DESCRIPTION OF THE DRAWINGS

The invention will become more readily apparent to those ordinarilyskilled in the art after reviewing the following detailed descriptionand accompanying drawings, in which:

FIG. 1 is a circuit block diagram schematically illustrating an RFdevice according to an embodiment of the present invention;

FIG. 2 is a circuit block diagram schematically illustrating an RFdevice according to another embodiment of the present invention;

FIG. 3 is a circuit diagram schematically illustrating a testing circuitaccording to an embodiment of the present invention;

FIG. 4 is a circuit diagram schematically illustrating a testing circuitaccording to another embodiment of the present invention; and

FIG. 5 is a flowchart schematically illustrating a testing methodaccording to an embodiment of the present invention.

DETAILED DESCRIPTION OF PREFERRED EMBODIMENTS

The invention will now be described more specifically with reference tothe following embodiments. It is to be noted that the followingdescriptions of preferred embodiments of this invention are presentedherein for purpose of illustration and description only. It is notintended to be exhaustive or to be limited to the precise formdisclosed.

Please refer to FIG. 1, in which an embodiment of an RF device accordingto the present invention is shown. In this embodiment, the RF device 10includes an RF circuit 100 and a testing circuit 150 performing atesting operation for determining an RF circuit characteristic of the RFdevice. The RF circuit 100 functions for receiving or transmitting RFsignals. An antenna is one of the examples. The testing circuit 150includes a testing-signal generating unit 152, a testing-signalsmoothing unit 154, a first filter unit 156 and a testing-resultinforming unit 158. The testing-signal generating unit 152 has a signaloutput 152 a, from which a testing signal Ts is outputted. Thetesting-signal smoothing unit 154 has a terminal 154 a electricallycoupled to the testing-signal generating unit 152 for receiving thetesting signal Ts. The first filter unit 156 has an external terminal156 a, which is referred to as a first external terminal, and anexternal terminal 156 b, which is referred to as a second externalterminal, wherein the first external terminal 156 a is electricallycoupled to the terminal 154 a of the testing-signal smoothing unit 154and the signal output 152 a so as to receive the testing signal Ts,while the second external terminal 156 b is electrically coupled to apredetermined test point of the RF circuit 100. The testing-resultinforming unit 158 has an external input 158 a, which is electricallycoupled to the terminal 154 a of the testing-signal smoothing unit 154,the signal output 152 a, and the external terminal 156 a. Thetesting-result informing unit 158 generates an informing signalaccording to an electric level at the external input 158 a.

Preferably, the testing-signal generating unit 152 exhibits propertiesof a low output impedance voltage source or a high output impedancecurrent source. The testing signal Ts may be itself or include a digitalsignal. For example, the testing signal Ts may be continuously high,like a constant DC voltage. In other words, it is a digital signal, eachbit of which is “1”. In another example, the testing signal Ts may becontinuously low, like a DC grounded voltage. In other words, it is adigital signal, each bit of which is “0”. Alternatively, the testingsignal Ts may be alternately high and low, like a middle or lowfrequency signal. In other words, it is a digital signal havingalternate “1” and “0” bits, i.e. 1, 0, 1, 0, 1, 0 . . . . Furthermore, avariety of digital signals having different duty cycles and/or waveformscan also be used as the testing signal. The waveforms, for example, maybe but not limited to square waves, triangle waves or sine waves.

Furthermore, the first filter unit 156 exhibits properties of highimpedance at high frequency and low impedance at middle or lowfrequency. The so-called high frequency indicates a specific band offrequency around the frequency of the radio-frequency signal, which isgenerally higher than about 300 MH, and will be referred to as “highband” hereinafter. On the other hand, the so-called middle or lowfrequency indicates a specific band of frequency around the frequency ofthe testing signal Ts generated by the testing-signal generating unit152, which is generally lower than a quarter of the high band frequency,and will be referred to as “middle/low band” hereinafter. As such,during the operation of the radio-frequency (RF) circuit 100, the RFsignal transmitted in the RF circuit 100 would not affect the operationof the testing circuit 150 due to the blocking effect of the firstfilter unit 156. In contrast, the first filter unit 156 will not blockthe testing signal Ts, so the RF circuit 100 serves one of thetransmission paths of the testing signal Ts. Consequently, the impedancechange of the RF circuit 100 will cause a change of an electric level ofthe testing circuit 150, e.g. the electric level received by thetesting-result informing unit 158 through the external input 158 a.

The testing-signal smoothing unit 154 used herein functions fortemporary energy storage and wave filtration for smoothing the waveformof the testing signal passing therethrough. Depending on practicaldesigns, the testing-signal smoothing unit 154 may stand alone or beincorporated into a filter unit of the testing circuit 150. Embodimentsand examples will be given as follows for illustrating the designs andmodifications.

Please refer to FIG. 2, which is a circuit block diagram schematicallyillustrating an RF device according to another embodiment of the presentinvention. Comparing the embodiment illustrated in FIG. 2 with thatillustrated in FIG. 1, the testing circuit 250 of the RF device 20 shownin FIG. 2 includes a second filter unit 257, which does not exist in theRF device 10 shown in FIG. 1. The second filter unit 257 is electricallycoupled to the first filter unit 156 and the testing-signal generatingunit 152, and has an external terminal 257 a, which is referred to as athird external terminal, electrically coupled to the testing-signalgenerating unit 152 for receiving the testing signal Ts, and an externalterminal 257 b, which is referred to as a fourth external terminal,electrically coupled to the external terminal 156 a of the first filterunit 156 and the external input 158 a of the testing-result informingunit 158. The second filter unit 257 is capable of providing an improvedhigh-frequency isolating effect for the testing-signal generating unit152 so as to protect the operation of the testing-signal generating unit152 from being affected by the RF signal transmitted in the high-powerRF circuit 100. The second filter unit 257 accomplishes theaforementioned objective with a required impedance effect in thespecified high band. Preferably, the second filter unit 257 provides animpedance effect similar to or better than the first filter unit 156.From another viewpoint, both the first filter unit 156 and the secondfilter unit 257 can be low-pass filters or band-pass filters.Alternatively, they may be one low-pass filter and one band-pass filter.As long as the objectives can be achieved, it is not intended to limitthe types of the filter units.

In addition to the abovementioned difference, the circuitry andoperational principle of the RF device 20 are similar to those of the RFdevice 10 illustrated in FIG. 1, so they will not be redundantlydescribed herein. It is to be noted that in spite a testing-signalgenerating unit is provided in each of the embodiments for generating atesting signal, the testing signal can alternatively be provided by anexternal device. Then there would be no need to dispose a testing-signalgenerating unit in the testing circuit or even in the RF circuit.

For example, referring to FIG. 3, a circuit block diagram schematicallyillustrating an RF device according to another embodiment of the presentinvention is shown. In this embodiment, the testing circuit 35 mainlyincludes a signal output 352 a, a first filter unit 356, a second filterunit 357 and a testing-result informing unit 358, and there is noindependent testing-signal generating unit existing in this embodimentof RF device. Instead, the signal output 352 a is electrically coupledto an external testing-signal generating unit (not shown), from whichthe testing signal Ts is received and provided for the testing circuit35.

In this embodiment, the first filter unit 356 includes an inductor L1and a capacitor C1. The inductor L1 has one terminal electricallycoupled to the external terminal 356 b and then to a testing point TP ofthe RF circuit (not shown). Another terminal of the inductor L1, i.e.the external terminal 356 a of the first filter unit 356, one terminalof the capacitor C1, the external terminal 357 b of the second filterunit 357 and the external input 358 a of the testing-result informingunit 358 are electrically coupled to one another. Another terminal ofthe capacitor C1 is electrically coupled to ground. The second filterunit 357 includes an inductor L2 and a capacitor C2. One terminal of theinductor L2, i.e. the external terminal 357 a of the second filter unit357, is electrically coupled to the signal output 352 a and one terminalof the capacitor C2. Another terminal of the inductor L2, i.e. theexternal terminal 357 b of the second filter unit 357, is electricallycoupled to the external input 358 a of the testing-result informing unit358 and the external terminal 356 a of the first filter unit 356.Another terminal of the capacitor C2 is electrically coupled to ground.

Herein, the capacitors C1 and C2 work together as the testing-signalsmoothing unit 154. That is, the capacitors C1 and C2 work together toprovide temporary energy-storing and wave-filtering effects forproviding a direct-current (DC) bias signal required by thetesting-result informing unit 358 at a subsequent stage.

As shown, the testing-result informing unit 358 in this embodimentincludes a rectifying unit 380 and a DC detecting unit 382. Therectifying unit 380 is electrically coupled to the external input 358 a,performs a rectifying operation for the electric level at the externalinput 358 a, and outputs a corresponding rectified signal Ws. The DCdetecting unit 382 is electrically coupled to the rectifying unit 380,receives the rectified signal Ws, and determines the contents of theinforming signal to be outputted by the testing-result informing unit358 according to the rectified signal Ws.

In this embodiment, the rectifying unit 380 includes a diode D1, aninductor L3 and a capacitor C3. The anode of the diode D1 iselectrically coupled to the external input 358 a, and the cathode iselectrically coupled to one terminal of the inductor L3. Anotherterminal of the inductor L3 is electrically coupled to one terminal ofthe capacitor C3, and another terminal of the capacitor C3 is grounded.The DC detecting unit 382 includes a transistor T1 and a resistor R1.The resistor R1 functions for voltage drop, and may be replaced withanother passive or active element, e.g. transistor or MOSFET. A controlterminal 382 a of the transistor T1 is electrically coupled to both theinductor L3 and the capacitor C3 of the rectifying unit 380, throughwhich the rectified signal Ws from the rectifying unit 380 is receivedto determine whether to conduct the electric path between a first path382 b and a second path 382 c. The second path 382 c is grounded, andthe first path 382 b, as well as the terminal R1 b of the resistor R1,is electrically coupled to the external output Out, where an outputelectric level Vout is outputted by the testing-result informing unit358 as the informing signal. Another terminal R1 a of the resistor R1 iselectrically coupled to the working voltage VDD.

In this embodiment, the transistor T1 is used as a switch element, andany other suitable switch element can be used as a replacement,depending on practical requirements.

For testing different RF circuit characteristics, the duty cycle of thetesting signal may need to be adaptively adjusted. With the specificallydesigned testing signal Ts, if the impedance of the RF circuit isnormal, the rectified signal Ws, which includes the DC bias voltage, isable to drive the transistor T1 to be enabled, and if the impedance isabnormal, the transistor T1 cannot be enabled by the rectified signalWs. Accordingly, whether the impedance of the RF circuit to be tested isnormal as designed can be determined according to the output electriclevel Vout. For example, if the transistor T1 is successfully enabled inresponse to the rectified signal Ws, the RF circuit is determined to benormal, and on the other hand, if the transistor T1 cannot be enabledwith the rectified signal Ws, the RF circuit is determined to beabnormal, e.g. short circuit. Whether the transistor T1 is successfullyenabled or not can be realized according to the output electric levelVout. A low level, e.g. approximating ground level in this example,detected at the external output indicates a conductive state, and a highlevel, e.g. approximating working level VDD in this example, detected atthe external output indicates a non-conductive state. The condition ofthe RF circuit can thus be readily discriminated by detecting the outputelectric level Vout.

In another embodiment, the testing-result informing unit 358 does notinclude the DC detecting unit 382. In this case, the rectified signal Wsis directly used for providing the contents of the informing signal. Inother words, by coupling the rectified signal Ws to an analog-to-digitalconverter (not shown), the testing-result informing unit 358 may givethe output of the analog-to-digital converter as the informing signal.Optionally, lighting alarm, sounding alarm or any other suitable type ofalarm may accompany the informing signal.

Alternatively, an oscilloscope may be integrated into the testingcircuit 35 to display the rectified signal Ws as the informing signal.Since a common oscilloscope is relatively bulky, it is suitable tocombine the oscilloscope with the testing circuit 35 to constitute anintegral and portable automation testing apparatus. The automationtesting apparatus can be used not only for routine testing operations ofRF circuits in a factory but also for maintenance of RF circuits outsidethe factory.

Please refer to FIG. 4, which is a circuit diagram schematicallyillustrating a testing circuit according to another embodiment of thepresent invention. With the comparison of FIG. 4 with FIG. 3, it can beseen that the DC detecting unit 382 shown in FIG. 3 is not included inthe testing circuit 45 shown in FIG. 4. The testing circuit 45 furtherdiffers from the testing circuit 35 in two capacitors C4 and C5. In theembodiment shown in FIG. 4, the capacitor C5 functions as thetesting-signal smoothing unit 154. In other words, the capacitor C5functions for temporary energy storage for providing a basic DC voltage,i.e. the aforementioned DC bias signal, required by the testing-resultinforming unit 358 at a subsequent stage. In spite the capacitors C1 andC2 also exhibit functions of temporary energy storage and wavefiltration, it is desirable to adjust the magnitude of the DC biassignal in the subsequent circuit by independently adjusting thecapacitance of the capacitor C5 without adversely affecting thefiltering performance. On the other hand, By alternate-current coupling,the capacitor C4 functions to reject the DC bias into the testing-signalgenerating unit (not shown) when the RF circuit 100 is an active load togive the DC bias.

As described above, the testing circuit 45 does not include theelectronic elements relevant to the DC detecting unit 382 shown in FIG.3. Therefore, the rectified signal Ws itself or the output of anadditional analog-to-digital converter in response to the rectifiedsignal Ws can be used as the informing signal. Optionally, lightingalarm, sounding alarm or any other suitable type of alarm may beactivated based on the value or derived parameter of the rectifiedsignal Ws.

In the above embodiments, a half-wave rectifier is used as therectifying unit. Nevertheless, it is known to those skilled in the artthat any other suitable type of rectifier, e.g. full-wave rectifier orbridge rectifier, may alternatively be used as the rectifying unit.

Afterwards, please refer to the flowchart shown in FIG. 5. A testingmethod according to an embodiment of the present invention isillustrated. In this embodiment, the testing method includes a stage Aand a stage B as shown. The stage A is an RF circuit generally performedin a factory, while the stage B is performed during the normal operationof the RF circuit. It is to be noted that the stages A and B describedabove are only examples and not to be limited thereto. For betterunderstanding, the method will be described further with reference toFIG. 1 as follows.

In the embodiment of the testing method illustrated in FIG. 5, a testingsignal is first supplied to the testing circuit 150 (Step S500) in theStage A. Then a testing result, i.e. the informing signal, is realizedfrom the testing-result informing unit 158 (Step S502), as describedabove. In Step S504, the testing result is compared with a defaultvalue, which is a theoretical value complying with the circuitry design.If the difference between the testing result and the default valueexceeds a threshold, proceed to Step S506 to have the RF circuitrepaired, and then go back to Step S500 to do the test again. On theother hand, if the testing result is determined to be consistent to thedefault value, e.g. the difference is below the threshold, in Step S504,proceed to Step S508 to store the testing result as the default valuefor subsequent comparison in Stage B. Although it is feasible to stilluse the theoretical value in the Stage B for comparison with furthertesting results, the use of the previously certified testing result asthe default value would make the subsequent tests more accurate becausethe possible deviations resulting from manufacturing errors of the RFcircuits can be inherently removed by the replacement of default valuefor comparison.

After the default value is updated and stored in Step S508, the RFdevice 10 is ready for delivery to the consumer. The RF device 10, afterbeing successfully installed and starting to operate, can automaticallyperform the testing procedures of Stage B. In Stage B, a testing signalis supplied to the testing circuit 150 (Step S510). Then a testingresult is realized from the testing-result informing unit 158 (StepS512). In Step S514, the testing result is compared with the new defaultvalue. If the testing result is determined to be consistent to the newdefault value, e.g. the difference between the testing result and thedefault value is below a threshold, go back to Step S510 for next test.On the other hand, if the testing result is determined to beinconsistent to the new default value, e.g. the difference exceeds thethreshold, in Step S514, proceed to Step S516 to issue an alarm signalfor requiring notice, repair or maintenance. Optionally, the RF circuit100 may be disabled by the alarm signal in some design.

In the above embodiment, the comparing operations in Step S504 and StepS514 can be performed by a processor disposed inside or outside the RFdevice 10. The processor, if being inside the RF device 10, may beindependent from or integrated with the testing-signal generating unit152. Alternatively, the comparing operations in Step S504 and Step S514can be performed with hardware circuitry. Take the DC detecting unit 382shown in FIG. 3 as an example. If the testing result is consistent tothe default value (or theoretical value), the output electric level Voutwould be at a low level, and it is determined that the RF circuit isnormal. In contrast, if the difference between the testing result andthe default value exceeds the threshold, the output electric level Voutwould be at a high level. With a hardware circuit which is capable ofinterpreting the output electric level Vout and taking correspondingactions, the alarm signal can be optionally issued without anyadditional processor.

It is to be noted that in the above embodiments, the abnormal conditionof the RF circuit indicates a short-circuit defect. However, other kindsof defects, e.g. open-circuit, may also be detected by the testingcircuit and method according to the present invention with minormodifications. The principles for detecting short-circuit andopen-circuit are actually the same except that the impedance values mayvary with the frequencies of the testing signals. Therefore, by varyingthe testing signal, whether the RF circuit is short-circuit oropen-circuit can be determined.

To sum up, according to the present invention, a filter unit is used toisolate the RF circuit from the testing circuit. Therefore, during theoperation of the testing circuit, the application frequency of thetesting signal would not be so high as to affecting the RF signal of theRF circuit adversely. Accordingly, the testing operation can beperformed without affecting the normal operation of the RF circuit.

While the invention has been described in terms of what is presentlyconsidered to be the most practical and preferred embodiments, it is tobe understood that the invention needs not be limited to the disclosedembodiment. On the contrary, it is intended to cover variousmodifications and similar arrangements included within the spirit andscope of the appended claims which are to be accorded with the broadestinterpretation so as to encompass all such modifications and similarstructures.

What is claimed is:
 1. A testing circuit performing a testing operationto determine an RF circuit characteristic of an RF device, comprising: afirst filter unit having a first external terminal electrically coupledto a testing signal and a second external terminal electrically coupledto an RF circuit of the RF device, wherein the first filter unit isconfigured to allow the testing signal to enter the RF circuit whileblocking an RF signal transmitted in the RF circuit from entering thetesting circuit; and a testing-result informing unit having an externalinput electrically coupled to the first external terminal, andgenerating an informing signal, which indicates the RF circuitcharacteristic, according to an electric level at the external input;wherein the testing-result informing unit includes: a rectifying unitelectrically coupled to the external input for rectifying the electriclevel at the external input to output a rectified signal; and a DCdetecting unit electrically coupled to the rectifying unit for receivingthe rectified signal, and outputting the informing signal according tothe rectified signal; wherein the DC detecting unit includes: a switchelement having a control terminal receiving therefrom the rectifiedsignal, a first path electrically coupled to an external output, and asecond path electrically coupled to a first default electric level,wherein whether to conduct the electric path between the first path andthe second path or not is determined according to the rectified signal;and a voltage drop element having one terminal electrically coupled to asecond default electric level and another terminal electrically coupledto the first path.
 2. The testing circuit according to claim 1, furthercomprising: a second filter unit having a third external terminalelectrically coupled to the testing signal and a fourth externalterminal electrically coupled to the first external terminal of thefirst filter unit.
 3. The testing circuit according to claim 1, furthercomprising: a testing-signal generating unit for generating andproviding the testing signal.
 4. The testing circuit according to claim1, further comprising: a testing-signal smoothing unit having oneterminal electrically coupled to the testing signal and the firstexternal terminal of the first filter unit.
 5. An RF device, comprising:an RF circuit for transmitting or receiving an RF signal; a testingcircuit performing a testing operation to detect an RF circuitcharacteristic of the RF device, comprising: a first filter unit havinga first external terminal electrically coupled to a testing signal and asecond external terminal electrically coupled to the RF circuit, whereinthe first filter unit is configured to allow the testing signal to enterthe RF circuit while blocking an RF signal transmitted in the RF circuitfrom entering the testing circuit; and a testing-result informing unithaving an external input electrically coupled to the first externalterminal, and generating an informing signal, which indicates the RFcircuit characteristic according to an electric level at the externalinput; wherein the testing-result informing unit includes: a rectifyingunit electrically coupled to the external input for rectifying theelectric level at the external input to output a rectified signal; and aDC detecting unit electrically coupled to the rectifying unit forreceiving the rectified signal, and outputting the informing signalaccording to the rectified signal; wherein the DC detecting unitincludes: a switch element having a control terminal receiving therefromthe rectified signal, a first path electrically coupled to an externaloutput, and a second path electrically coupled to a first defaultelectric level, wherein whether to conduct the electric path between thefirst path and the second path or not is determined according to therectified signal; and a voltage drop element having one terminalelectrically coupled to a second default electric level and anotherterminal electrically coupled to the first path.
 6. The RF deviceaccording to claim 5, further comprising: a second filter unit having athird external terminal electrically coupled to the testing signal and afourth external terminal electrically coupled to the first externalterminal of the first filter unit.
 7. The RF device according to claim5, further comprising: a testing-signal generating unit for generatingand providing the testing signal.
 8. The RF device according to claim 5,further comprising: a testing-signal smoothing unit having one terminalelectrically coupled to the testing signal Ts and the first externalterminal of the first filter unit.